JPH051610B2 - - Google Patents

Info

Publication number
JPH051610B2
JPH051610B2 JP59167780A JP16778084A JPH051610B2 JP H051610 B2 JPH051610 B2 JP H051610B2 JP 59167780 A JP59167780 A JP 59167780A JP 16778084 A JP16778084 A JP 16778084A JP H051610 B2 JPH051610 B2 JP H051610B2
Authority
JP
Japan
Prior art keywords
optical system
signal light
selection means
alignment
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59167780A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6147633A (ja
Inventor
Minoru Kaneda
Ichiro Ishama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP59167780A priority Critical patent/JPS6147633A/ja
Priority to US06/763,710 priority patent/US4717257A/en
Publication of JPS6147633A publication Critical patent/JPS6147633A/ja
Publication of JPH051610B2 publication Critical patent/JPH051610B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP59167780A 1984-08-13 1984-08-13 投影露光装置及びこの装置における位置合わせ方法 Granted JPS6147633A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP59167780A JPS6147633A (ja) 1984-08-13 1984-08-13 投影露光装置及びこの装置における位置合わせ方法
US06/763,710 US4717257A (en) 1984-08-13 1985-08-08 Alignment device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59167780A JPS6147633A (ja) 1984-08-13 1984-08-13 投影露光装置及びこの装置における位置合わせ方法

Publications (2)

Publication Number Publication Date
JPS6147633A JPS6147633A (ja) 1986-03-08
JPH051610B2 true JPH051610B2 (en]) 1993-01-08

Family

ID=15855969

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59167780A Granted JPS6147633A (ja) 1984-08-13 1984-08-13 投影露光装置及びこの装置における位置合わせ方法

Country Status (2)

Country Link
US (1) US4717257A (en])
JP (1) JPS6147633A (en])

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6139021A (ja) * 1984-07-31 1986-02-25 Canon Inc 光学装置
US4937618A (en) * 1984-10-18 1990-06-26 Canon Kabushiki Kaisha Alignment and exposure apparatus and method for manufacture of integrated circuits
JPH0627904B2 (ja) * 1986-02-06 1994-04-13 旭光学工業株式会社 レーザービームの走査光学系
JPS63229816A (ja) * 1987-03-19 1988-09-26 Nikon Corp アライメント装置
JP2514037B2 (ja) * 1987-07-02 1996-07-10 キヤノン株式会社 検知光学系
US5684556A (en) * 1994-06-02 1997-11-04 Canon Kabushiki Kaisha Process for producing liquid crystal device
JP3352286B2 (ja) * 1995-07-13 2002-12-03 キヤノン株式会社 位置制御方法及び装置並びにそれを使用した半導体製造装置
US5748323A (en) * 1997-01-23 1998-05-05 Advanced Micro Devices Method and apparatus for wafer-focusing
JP2009094350A (ja) * 2007-10-10 2009-04-30 Canon Inc 露光装置及び補正装置
US10398614B2 (en) * 2015-11-02 2019-09-03 Sage Products, Llc Apparatus and system for lifting, moving, turning, and positioning a patient

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2843282A1 (de) * 1977-10-05 1979-04-12 Canon Kk Fotoelektrische erfassungsvorrichtung
JPS58108745A (ja) * 1981-12-23 1983-06-28 Canon Inc 転写装置

Also Published As

Publication number Publication date
US4717257A (en) 1988-01-05
JPS6147633A (ja) 1986-03-08

Similar Documents

Publication Publication Date Title
JP3181050B2 (ja) 投影露光方法およびその装置
US4362385A (en) Process and arrangement for copying masks on a workpiece with arrangement for correction of alignment errors
JP2785146B2 (ja) 自動焦点調整制御装置
JP2756620B2 (ja) 半導体露光方法およびその装置
US4669867A (en) Alignment and exposure apparatus
JPS61174717A (ja) 位置合わせ装置
JPH051610B2 (en])
JP3335126B2 (ja) 面位置検出装置及びそれを用いた走査型投影露光装置
US7106419B2 (en) Exposure method and apparatus
JP3218984B2 (ja) 半導体ウエハ上の不要レジストを除去するためのウエハ周辺露光方法および装置
JP3428825B2 (ja) 面位置検出方法および面位置検出装置
JP2007512694A (ja) マスク位置調節装置における直接的アライメント
JPH1050600A (ja) 投影露光方法及び投影露光装置
JPH01194322A (ja) 半導体焼付装置
JPH07201713A (ja) 露光装置及び露光方法
JPS63107139A (ja) 感光基板のアライメント方法
JPH1064980A (ja) 面位置検出装置および方法
JPH09320920A (ja) 露光装置の調整方法
JPH01228130A (ja) 投影露光方法およびその装置
JPS60177625A (ja) 投影露光装置
JPH0577168B2 (en])
JP2000195770A (ja) 傾き補正方法およびデバイス製造方法
JPH10335208A (ja) 露光装置の露光方法
JP2829649B2 (ja) アライメント装置
JPS6134939A (ja) 半導体焼付装置